@article{aufsatz32234,
affiliation = {Professur für Halbleitertechnik},
title = {Applications of Microstructured Silicon Wafers as Internal Reflection Elements in Attenuated Total Reflection Fourier Transform Infrared Spectroscopy},
journal = {Applied Spectroscopy},
keywords = {-},
pages = {1022--1027},
year = {2010},
peerreview = {Ja},
volume = {64},
number = {9},
author = {Schumacher, H. and Künzelmann, U. and Vasilev, B. and Eichhorn, K.-J. and Bartha, J.W.}
}