BibTex - Publikationen
    affiliation = {Professur für Halbleitertechnik},
    title = { In-situ real-time Spectroscopic Ellipsometry for the investigation of Atomic Layer Depositions on Graphene.},
    journal = { 9th Workshop Ellipsometry : February 23-25, 2015 University of Twente in Enschede, the Netherlands},
    keywords = {-},
    year = {2015},
    peerreview = {Nein},
    openaccess = {Nein},
    author = {Junige, M. and Oddoy, T. and Geidel, M. and Darakchieva, V. and Yakimova, R. and Wenger, C. and Lupina, G. and Albert, M. and Schubert, M. and Bartha, J.W.}