@conference{aufsatz69350,
    affiliation = {Betriebswirtschaftslehre, insb. Logistik},
    title = {The correct level of model complexity in semiconductor fab simulation - Lessons learned from practice},
    journal = {27th Annual IEEE/SEMI® Advanced Semiconductor Manufacturing Conference (ASMC). Saratoga Springs, NY, USA, Mai 2016},
    keywords = {-},
    pages = {133--139},
    year = {2016},
    peerreview = {Ja},
    openaccess = {Ja},
    author = {Rank, Sebastian and Hammel, Christian and Schmidt, Thorsten and Müller, Jan and Wenzel, André and Lasch, Rainer and Schneider, Germar}
}