@article{aufsatz81925,
    affiliation = {Professur für Optoelektronik},
    title = {THERMAL RELAXATION PHENOMENA IN THE FORMATION OF DEVICE-QUALITY SIO2/SI INTERFACES},
    journal = {JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS},
    pages = {6196--6199},
    issn = {0021-4922},
    year = {1993},
    peerreview = {Nein},
    volume = {32},
    number = {12B},
    doi = {doi:10.1143/JJAP.32.6196},
    author = {LUCOVSKY, G and BJORKMAN, CH and YASUDA, T and EMMERICHS, U and MEYER, C and LEO, K and KURZ, H}
}