@article{aufsatz81927,
    affiliation = {Professur für Optoelektronik},
    title = {MODULATED ELLIPSOMETRY FOR CHARACTERIZATION OF MULTIPLE-QUANTUM WELLS AND SUPERLATTICES},
    journal = {THIN SOLID FILMS},
    pages = {112--116},
    issn = {0040-6090},
    year = {1993},
    peerreview = {Nein},
    volume = {233},
    number = {1-2},
    doi = {doi:10.1016/0040-6090(93)90070-6},
    author = {ZETTLER, JT and MIKKELSEN, H and TREPK, T and LEO, K and KURZ, H and RICHTER, W}
}